The Vertical Microstructure Profiler (VMP) is an in situ full ocean-depth profiling system manufactured by Rockland Scientific. It consists of several sensors that collect profile measurements of turbulence, temperature, conductivity, and other ocean parameters. A VMP is deployed from ships and operates autonomously. It can collect profile measurements up to 6000 m in depth. It has a nominal sampling frequency of 512 Hz.

Instrument Details
- Multi
- Earth Science > Oceans > Ocean Optics > TurbidityEarth Science > Oceans > Ocean Pressure > Water PressureEarth Science > Oceans > Ocean PressureEarth Science > Oceans > Ocean Optics > FluorescenceEarth Science > Oceans > Salinity/density > ConductivityEarth Science > Oceans > Ocean Circulation > TurbulenceEarth Science > Oceans > Ocean Chemistry > OxygenEarth Science > Oceans > Ocean TemperatureEarth Science > Oceans > Ocean Temperature > Water Temperature
- Subsurface - Sea/Ocean/Water
- 512 Hz
- N/A
- N/A
- Currently unavailble
Currently unavailable
Currently unavailable
Rockland Scientific
Currently unavailable
Currently unavailable
Unpublished
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