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Instrument

VMP
Vertical Microstructure Profiler

The Vertical Microstructure Profiler (VMP) is an in situ full ocean-depth profiling system manufactured by Rockland Scientific. It consists of several sensors that collect profile measurements of turbulence, temperature, conductivity, and other ocean parameters. A VMP is deployed from ships and operates autonomously. It can collect profile measurements up to 6000 m in depth. It has a nominal sampling frequency of 512 Hz.

NASA's DC-8 flying laboratory passes Antarctica's tallest peak, Mount Vinson, on Oct. 22, 2012, during a flight over the continent to measure changes in the massive ice sheet and sea ice. Credit: NASA/Michael Studinger (Photography courtesy NASA Images)

Instrument Details

Multi
Earth Science > Oceans > Ocean Optics > Turbidity
Earth Science > Oceans > Ocean Pressure > Water Pressure
Earth Science > Oceans > Ocean Pressure
Earth Science > Oceans > Ocean Optics > Fluorescence
Earth Science > Oceans > Salinity/density > Conductivity
Earth Science > Oceans > Ocean Circulation > Turbulence
Earth Science > Oceans > Ocean Chemistry > Oxygen
Earth Science > Oceans > Ocean Temperature
Earth Science > Oceans > Ocean Temperature > Water Temperature
Subsurface - Sea/Ocean/Water
512 Hz
N/A
N/A
Currently unavailble
  • Currently unavailable

  • Currently unavailable

  • Rockland Scientific

  • Currently unavailable

  • Currently unavailable

SPURS

Salinity Processes in the Upper Ocean Regional Study

2012—2017
Subtropical North Atlantic Ocean, Tropical Eastern Pacific Ocean
view all deployment dates
2 Deployments
· 41 Data Products
SPURS

Salinity Processes in the Upper Ocean Regional Study

2012—2017
Subtropical North Atlantic Ocean, Tropical Eastern Pacific Ocean
view all deployment dates
2 Deployments
· 41 Data Products